BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//SBIR Signal//Deadline Calendar//EN
CALSCALE:GREGORIAN
METHOD:PUBLISH
X-WR-CALNAME:SBIR/STTR deadline
BEGIN:VEVENT
UID:sbir-opportunity-4433@sbirsignal
DTSTAMP:20260909T204926Z
DTSTART;VALUE=DATE:20261021
DTEND;VALUE=DATE:20261022
SUMMARY:Defect Metrology and Charge Trapping Dynamics in Transfer-Doped Dia
 mond Transistors — SBIR deadline
DESCRIPTION:OSD SBIR topic closes on 2026-10-21. Topic OSW26BZ06-NV026. htt
 ps://sbirsignal.com/opportunity/4433
URL:https://sbirsignal.com/opportunity/4433
END:VEVENT
END:VCALENDAR