Sears Scientific Consulting LLC — National Aeronautics and Space Administration SBIR Phase I: S1
Sears Scientific Consulting LLC — SBIR Phase I award from National Aeronautics and Space Administration.
- Amount
- $111,699
- Agency
- National Aeronautics and Space Administration
- Program / Phase
- SBIR · Phase I
- Topic
- S1
- Solicitation
- SBIR_21_P1
- NAICS
- —
- Place of performance
- OR
- Period
- 2021-05-03 → 2021-11-19
Description
We propose to investigate the utilization of additive manufacturing (AM) techniques for the fabrication of analytical instrumentation especially those requiring high or ultra-high vacuum environment to function.nbsp; This includes particle optic systems such as electron and ion microscopes, X-ray sources, and mass spectrometers.nbsp; By leveraging AM, the weight, cost, and development time can all be significantly reduced, further enabling the exploration capabilities of NASA programs.nbsp;Among AM processes we propose to utilize stereolithographic (SLA) printing due to its ability to provide the highest resolution while producing void-free prints with little built in stress that could later deform the part. nbsp;The prints will use engineering resins able to survive high temperatures gt;200˚C to survive the harsh environment of space.nbsp; In addition to the base material, plating-on-plastic will be used to form thick (50-100micro;m) copper/nickel layer that further strengthens the part while reducing outgassing to that of other metal surfaces and provides the electrostatic surface.nbsp; For parts needing to remain electrically isolating, atomic layer deposition of alumna (Al2O3) can be used to mitigate outgassing, or the part can be printed directly into a ceramic-photopolymer resin which is later fired to produce a fully ceramic part.nbsp;For this proposal we will design test articles to verify outgassing performance, measure part accuracy, perform electrical testing on ceramic stand-offs fabricated via AM, and produce an assembled mock-up of a focused ion column to vet the assembly methodology and test high voltage stand-off strength.nbsp; nbsp;nbsp;nbsp;nbsp;