NANOELECTRONIC IMAGING, INC. — Department of Defense SBIR Phase I: DMEA192-001

NANOELECTRONIC IMAGING, INC. — SBIR Phase I award from Department of Defense.

Amount
$167,455
Agency
Department of Defense · Defense Microelectronics Activity
Program / Phase
SBIR · Phase I
Topic
DMEA192-001
Solicitation
19.2
NAICS
Place of performance
CA
Period
2019-11-25 → 2020-06-02

Description

High-resolution, transmission electron microscope, electron beam induced current, EBIC, STEM EBIC, temperature, thermometry