FLIGHTWARE INC — Department of Defense SBIR Phase II: DLA181-002

Description

The In-Process Control for L-PBF (IPCL) Phase II program extends very successful Phase I results. We demonstrated that our LTM software correctly detected layer flaws with 98% to 99% accuracy. We also demonstrated that 1-layer and 3-layer flaws could be successfully repaired or healed using two different Repair processes we developed, with more than 80% reduction in porosity. In Phase II we will extend this work significantly, generating ~10X the number of coupons and scans. We will analyze a number of different ways to extend LTM application for in-process inspection of several other flaws, features and repairs. We’ve teamed with UTC and EWI, two highly regarded organizations in metal AM development. EWI will develop an advanced profilometer to scan the entire print bed at very high rates and resolution. This device will be installed in UTC’s OPENSLM commercial printer, where all coupon and part fabrication shall be performed. At the conclusion of the program we anticipate this technology will be made available to the market through UTC’s commercial AMSENSE and OPENSLM products. This team provides best value to DLA by combining the strength of our organizations in sensors, printers and software and accelerating commercialization and insertion into DLA’s supply chain.