MICROELECTRONICS RESEARCH DEVELOPMENT CORPORATION — Department of Defense STTR Phase II: DTRA16A-003

Description

Micro-RDC has developed portable radiation effects test structures that scale to new process nodes.These structures will enable the investigation of the effects of radiation on the new technology from the material processing level as well as the circuit level.Fabricating the chosen structures and the refinement of software to extract the model parameters will be completed in this effort.A suite of test structures can be used to create the model parameters with coverage for the variety of transistor geometries commonly used in the process.This effort will focus on extracting the relevant parameters from electrical characterization over Total Ionizing Dose and Single Event Effects.The extracted parameters from the chosen test structures will allow for the construction of accurate simulation models.Subscribers will be able to predict radiation effects without having to run expensive test chips.This effort will appeal to programs needing efficiency in both schedule and cost for aerospace end users.Due to the expense of advanced nodes, the cost saving represented by program developed technology will have a significant licensing demand.The licensed technology will be provided as an extension to the Foundry PDK.