OPTIMAX SYSTEMS, INC. — National Aeronautics and Space Administration SBIR Phase I: S2

Description

<p style="margin-left:0in; margin-right:0in">NASA has identified freeform optics as an integral part of their future optical systems. Reducing the cost of freeforms will be crucial in accelerating the integration of freeforms into cost-sensitive NASA optical systems. &nbsp;One method to reduce cost is to reduce the metrology time needed to characterize the freeforms. This is especially true when measuring the mid-spatial frequency errors induced during the manufacturing process. Current methods are tactile measurement devices such as a coordinate measurement machine and profilometers. These metrology methods slow the manufacturing process and therefore increase cost. The goal of this NASA Phase 1 SBIR is to develop and investigate a unique deflectometry enclosure to improve efficiency of the manufacturing of freeform optics. This proposed innovation is a multi-camera multi-monitor deflectometry system that can be integrated into manufacturing. It would increase efficiency of the freeform manufacturing process by greatly reducing the time to measure the mid-spatial frequency errors of the freeform&nbsp;part and therefore would reduce the time and cost of freeform manufacturing.</p>