Alcatera Inc. — Department of Defense STTR Phase I: A17A-T008
Alcatera Inc. — STTR Phase I award from Department of Defense.
- Amount
- $147,229
- Agency
- Department of Defense · Army
- Program / Phase
- STTR · Phase I
- Topic
- A17A-T008
- Solicitation
- 2017.0
- NAICS
- —
- Place of performance
- CA
- Period
- 2017-07-20 → 2018-01-30
Description
Near-Field Scanning Microwave Microscopy (SMM) is a technique relying on a raster scan of a microwave probe across a sample surface, while measuring its reflected microwave signal. The existing technologies are limited to the surface analysis, and are not compatible with liquid environment. These limitations are addressed by the proposed wideband 3D tomography SMM with sub-surface analysis capability enabling novel commercial and industrial applications such as semiconductor inspection that require the need of non-invasive material analysis. Likewise, biological sample analysis and threat detection would greatly benefit from such technique.