NOKOMIS INC — Department of Defense SBIR Phase I: AF161-142

Description

ABSTRACT: In this Phase I, Nokomis will knit together its unique and state of the art Radiated Electromagnetic Emissions (REME) Analysis capabilities enabled by its Hiawatha sensor to generate data that substantiates the ability of DER ICs to be used for DoD applications and will develop a framework for the corresponding Test and Evaluation protocols that would be used to certify DER ICs. Specifically, Nokomis will combine Hiawathas unparalleled sensitivity, demonstrated acuity, and embedded software capability with Nokomis unique understanding of REME Analysis to 1) distinguish between known good and counterfeit, altered, or damaged devices that would be used as starting points for a DER IC, and 2) utilize the evolution of the devices predicted RUL throughout the DER process and post-DER qualification as an diagnostic and predictor of performance stability and long-term reliability (PS/LTR) for the devices.This will allow Nokomis to demonstrate how to select an IC as a viable candidate for DER, and to, once selected, certify the DER process for that particular IC. The results of this Phase I will demonstrate that with a process that includes REME analysis, DER ICs will become a viable and useful component of existing and future Air Force programs.; BENEFIT: This Research and Development will pave the way for an expanded and generalized DER analysis toolset, along with more nuanced prediction and assessment techniques. These tools and techniques will then be leveraged to assess and qualify a wider range of DER IC candidates that would then be integrated into platforms that to fulfill critical mission requirements in both the military and commercial spaces. As parts specifically designed for extreme conditions become less and less available for legacy systems and a smaller percentage of the commercial electronics market, being the pre-eminent intellectual property holder of DER assessment tools, techniques, and knowledge allows Nokomis to effectively capture significant market share. Further, by developing a comprehensive and well-established process, Nokomis positions itself well as a developer of certification processes. This opens the doors to many commercial opportunities when a need is established that requires the procurement or integration of a DER enabled IC. In addition, the proposed technology uniquely addresses the ability to test, evaluate, and certify DER parts as well as continue to monitor them throughout their lifecycles to allow for condition based maintenance such that initial certification would not be the only commercial revenue steam.