Physical Optics Corporation — Department of Defense SBIR Phase I: AF161-034

Description

ABSTRACT: To address this Air Force need for high-accuracy active optical fiber metrology, Physical Optics Corporation (POC) proposes to develop a new High-Precision Optical Fiber Inspection (HIPROOF) system based on a novel type of X-ray inspection of the fiber structure, which provides information on the dopant concentration and refractive index distribution. Specifically, the innovation in the X-ray imaging technique and data analysis algorithms will enable the HIPROOF system to measure the three-dimensional (3D) distribution of ytterbium and thulium in a fiber with accuracy of 0.1 wt.%, and determine the refractive index profile with accuracy of 10^-4, which directly address the Air Force metrology requirements. In Phase I, POC will demonstrate the feasibility of the HIPROOF system by designing, fabricating, and testing a prototype system reaching technology readiness level (TRL)-4. In Phase II, POC plans to build a functional TRL-5/-6 HIPROOF system capable of performing high-accuracy active fiber metrology, in accordance with the Air Force performance specifications, and deliver the final system to the Air Force.; BENEFIT: Target Military/Government Applications. The Phase III HIPROOF will be a high-precision, versatile, and reliable optical fiber metrology system, capable of inspecting large mode area (LMA) fibers with arbitrary geometry. The system will provide chemical and optical characterization of the fiber properties required for efficient beam combining in high-power laser arrays. Due to its compact size and the simplicity of the interface, the HIPROOF will enjoy straightforward integration into the current and future Air Force high-power fiber R&D efforts.Target Commercial Applications: HIPROOF-derived systems, based on the multispectral X-ray computed tomography (MSXCT) approach, can be used for comprehensive nondestructive evaluation/testing (NDE/NDT) of optical fibers and other microstructures, in applications where not only high-resolution dimensional measurements, but also the knowledge of chemical composition and optical properties are important.