VESCENT TECHNOLOGIES INC. — Department of Defense SBIR Phase I: AF151-080

VESCENT TECHNOLOGIES INC. — SBIR Phase I award from Department of Defense.

Amount
$149,994
Agency
Department of Defense · Air Force
Program / Phase
SBIR · Phase I
Topic
AF151-080
Solicitation
2015.1
NAICS
Place of performance
CO
Period
2015-06-08 → 2016-04-10

Description

ABSTRACT:Positioning, navigation and timing (PNT) has been a central technology to the armed forces and the Air Force since their inception, and PNTs importance only stands to grow as we forge ahead in the 21st century. Just as todays state of the art PNT harness the quantum states of light in laser based sensors, the next levels of fidelity in both timing and inertial measurement units (IMUs) will harness the quantum states of matter in atomic sensors. To realize a field deployable atomic sensor the diode laser systems that drive them must mature. The biggest technical challenge to the laser system is keeping them locked to an atomic transition over the long term. We propose to develop methods to eliminate laser mode hops through laser design and optical monitoring to solve this technical challenge.BENEFIT:There exist a the wide range of fast-light and cold-atom applications that are beginning to move from the laboratory into the field. These applications all need laser systems similar to that proposed here. Gravity sensors have security applications such as sensing of hidden tunnels or hidden intruders behind walls or in tunnels. Inertial sensors enable precise global navigation without the need for GPS. Quantum computers could enable more efficient search algorithms and are important in cryptography. New magnetic sensors could be used for detection of brain waves in medical imaging, detection of submarines, underwater mines, and other forms of surveillance. Atomic clocks are needed for increased demands on network synchronization for Internet data transmission and 3G networks. Ultra-cold ion and electron beams could improve resolution for ion milling machines and electron beam microscopy.