XSB INC — Department of Commerce SBIR Phase I: 9.05.01.40-TT
XSB INC — SBIR Phase I award from Department of Commerce.
- Amount
- $100,000
- Agency
- Department of Commerce · National Institute of Standards and Technology
- Program / Phase
- SBIR · Phase I
- Topic
- 9.05.01.40-TT
- NAICS
- —
- Place of performance
- MD
- Period
- 2015-09-15 → 2016-03-15
Description
The objective of this project is to demonstrate a resonant scan lens (RSL) that increases the uniformity of beam scans projected from resonant optomechanical systems. While resonant optomechanical systems generate high-speed beam scans, large mechanical displacements, and robust operation from miniature form factors, scans projected from such systems lack uniformity across the field-of-view (FOV). In these systems, light projected from the scanner is focused by a scan lens and the outer, non-uniform portion of the scanned FOV is typically clipped or blanked. Z-senz will research and develop a resonant scanner and RSL to create a more uniform scan projected from the scan lens, thus improving system performance.