JENTEK SENSORS, INC. — Department of Defense SBIR Phase II: N07-168

Description

This program will accelerate transitioning of high-throughput versions of JENTEKs MWM Array eddy-current sensors and GridStation impedance instruments to the U.S. Navy. The proposed systems will have between 350 and 600 fully parallel impedance channels. With greater data acquisition speed from each channel and with substantial increase in the number of fully parallel channels, larger surface areas, such as webs, bores and large parts can be inspected far more efficiently and quickly. Furthermore, multiple features, such as all the holes at a given mounting surface on a disk, can be inspected simultaneously.The inspection capability will be enhanced by a data archiving function which records component conditions, historical crack growth rates (determined from MWM-Array mapping and tracking methods), and residual stress relaxation.The overall program focus is on achieving a 20 times increase in the inspection throughput (compared to conventional Eddy Current Testing, ET). This throughput improvement should enable one system to replace three conventional systems for many inspections providing an additional reduction in acquisition and operating costs.