NOKOMIS INC — Department of Defense SBIR Phase II: The primary objective of this Phase II is to develop more complete part class coverage for

Description

The primary objective of this Phase II is to develop more complete part class coverage for the ADEC system. During Phase I, Nokomis demonstrated ADEC"s authentication capabilities. ADEC detects counterfeits through automated analysis of unintended radiated emissions that are characteristic of the internal circuitry of the device. This allows ADEC to rapidly detect multiple classes of counterfeits, including aged/recycled parts, upmarked/mismarked components, etc. as anything that alters the internal circuitry results in a change in emission phenomenology. ADEC has been matured for complex Integrated Circuits (ICs) such as microprocessors, microcontrollers, memory, and programmable logic devices, but only limited analyses have been performed on other device classes (analog devices, passives, and non-silicon based electronics). Under this effort, Nokomis will expand ADEC to cover these device classes and consequently provide a single system that is able to screen for all classes of counterfeit electronics. The effort will culminate in a demonstration of ADEC performance showing its effectiveness against a broad range of device classes, from passives and discrete parts to complex ICs. Approved for Public Release 14-MDA-7979 (16 September14).