RADIABEAM TECHNOLOGIES, LLC — Department of Commerce SBIR Phase II: Accurate quantitative characterization of materials is crucial for a wide range of industr
RADIABEAM TECHNOLOGIES, LLC — SBIR Phase II award from Department of Commerce.
- Amount
- $300,000
- Agency
- Department of Commerce · National Institute of Standards and Technology
- Program / Phase
- SBIR · Phase II
- NAICS
- —
- Place of performance
- CA
- Period
- —
Description
Accurate quantitative characterization of materials is crucial for a wide range of industrial and research applications. New transmission scanning electron microscopy (t-SEM) methods have the potential for high-resolution imaging similar to transmission electron microscopy (TEM) with a less expensive, more widely available SEM system. In Phase I, RadiaBeam Technologies demonstrated the feasibility of a novel t-SEM detection scheme based on digital micromirror device technology. In Phase II, a prototype detector will be developed and integrated into a standard SEM system. Its synchronization with the scanning beam, as well as its ability to perform transmission electron diffraction imaging, dark-field imaging, and angular selection will be demonstrated and characterized.