NU-TREK, INC. — Department of Defense SBIR Phase I: ABSTRACT: Nu-Trek, in partnership with ASU and Lockheed Martin, will develop a Universal

Description

ABSTRACT: Nu-Trek, in partnership with ASU and Lockheed Martin, will develop a Universal Reliability (URel) System that includes a URel system-on-chip (SOC) and URel software (SW). The URel SOC provides high frequency test signals (1-10 GHz) to the device under test (DUT), receives the signal at each test point in the DUT signal chain, and converts the amplitude of the signal at each point in the DUT to a DC signal through the use of an RF peak detector. The URel SOC measures the DC current, gain, and compression point of each test point in the DUT signal chain and sends the test data to the URel SW processor. The URel SW determines not only what issues the DUT has at the time of the test, but also projects what reliability issues will develop over the lifetime of the DUT. In Phase I Nu-Trek will develop system and sub-block requirements, design the URel SOC, and collaborate with ASU to define the diagnostic/reliability algorithm. The compact, low price URel SOC enables device testing over long periods of time, under stress conditions, and while in operation. The URel System provides unprecedented insight into expected performance over the DUT lifetime. BENEFIT: Automatic Test Equipment (ATE) typically used to test devices is very large and costs hundreds of thousands of dollars. This constrains the amount of testing that is possible and affordable, often limiting it to pass/fail determinations. In the proposed work, Nu-Trek, in partnership with ASU and Lockheed Martin, will develop a Universal Reliability (URel) System that includes a URel system-on-chip (SOC) and URel software (SW). The compactness, robustness, and low price point of the URel SOC enables device testing over long periods of time, under high temperature and other environmental stress conditions, and while in operation. The URel SW provides unprecedented insight into expected performance over the lifetime of the device.