RADIABEAM TECHNOLOGIES, LLC — Department of Commerce SBIR Phase I: Accurate quantitative characterization of materials is crucial for a wide range of industr

Description

Accurate quantitative characterization of materials is crucial for a wide range of industrial and research applications. New transmission scanning electron microscopy (t-SEM) methods have the potential for high-resolution imaging similar to transmission electron microscopy (TEM) with a less expensive, faster, and more widely available SEM system. To exploit the full potential of these imaging techniques, a more specialized detector is required. The novel detection system proposed will utilize a digital micromirror device for achieving precise selection of any combination of small angular portions over a large area of the diffraction plane and will easily transition between the production of bright field and dark field images and transmission diffraction patterns.