Fm Technologies Inc — Department of Energy SBIR Phase I: The development of high-current, short-duration pulses of electrons has been a challenging

Fm Technologies Inc — SBIR Phase I award from Department of Energy.

Amount
$150,000
Agency
Department of Energy
Program / Phase
SBIR · Phase I
Solicitation
DE-FOA-0000413
NAICS
Place of performance
VA
Period
2011-06-17 → 2012-05-16

Description

The development of high-current, short-duration pulses of electrons has been a challenging problem for many years. High current pulses are widely used in injector systems for electron accelerators, both for industrial linacs as well as high-energy accelerators for linear colliders. Short-duration pulses are also used for microwave generation, in klystrons and related devices, for injectors to perform research on advanced methods of particle acceleration, and for injectors used as free-electron-laser (FEL) drivers. The proposed method to be described below is promising because of a natural bunching process which self-synchronizes to the rf, thus eliminating the need for pre-buncher section(s), timing system, and laser. Also, the repetition rate can be orders of magnitude greater. FM Technologies proposes a novel high current, picosecond X-band injector system which is named the X-Band Bunched Electron Injector (XBEI). The heart of the XBEI is a self-bunching electron gun the Micro-Pulse Gun (MPG). By adding an external electron amplifier stage and high energy RF post acceleration an inexpensive, simple, robust electron injector would be the outcome. Phase I is aimed at measurements of: electron current gain, charge per bunch, rf power, beam power and other key parameters. Commercial Applications and Other Benefits: If successful, this micro XBEI will provide a high power, low emittance, picosecond-long electron source which is suitable for many applications. Of particular interest are high energy picosecond electron injectors for linear colliders, free electron lasers, medical and industrial rf linacs, a high-harmonic, high-frequency driver for rf sources and accelerator test facilities.