X-Wave Innovations, Inc. — Department of Commerce SBIR Phase I: The measurement and quality control for smooth engineering surfaces are becoming more and
X-Wave Innovations, Inc. — SBIR Phase I award from Department of Commerce.
- Amount
- $89,994
- Agency
- Department of Commerce · National Institute of Standards and Technology
- Program / Phase
- SBIR · Phase I
- NAICS
- —
- Place of performance
- MD
- Period
- — → 2013-03-08
Description
The measurement and quality control for smooth engineering surfaces are becoming more and more important in modern science and technology due to their important engineering functions and high production costs. NIST has frequently received requests for U.S. industry to provide Standard Reference Material (SRM) high-precision, random profile roughness specimens to support smooth surface measurements. However, the fabrication process develop by a NIST researcher was complicated, which hinders the availability of the SRM specimens. In this proposal, X-wave Innovations, Inc. (XII) proposes an automated lapping apparatus and process, which is based on the idea and claims outlined in NIST’s expired patent, for fabricating the high-precision, random profile roughness specimens. The proposed apparatus and process possess advantages such a high manufacturing throughput, high reproducibility, and low operation cost. The success of this SBIR effort will result in an automated apparatus for manufacturing SRM high-precision, random profile roughness specimens for NIST to support U.S. manufacturing industry.