JENTEK SENSORS, INC. — Department of Transportation SBIR Phase I: 111PH1

Description

There is a well defined, yet unfulfilled need for a convenient (non-contact, light weight) and rapid imaging tool for multi-directional, thru-wall stresses (both applied and residual) from the outside of a pipeline. Quantitative stress imaging is needed at mechanical damage and corrosion sites, as well as at other critical locations (dents, bends, etc.). JENTEK is uniquely positioned to deliver a low cost and reliable solution to this problem that will promote enhanced pipeline safety and vastly improved understanding of residual and applied stress conditions. We have already developed a high resolution, wide bandwidth (i.e., from low to high frequency) impedance measurement method called the MwM-Array, including the many channel electronics and software needed for rapid data acquisition, analysis, and reporting. This Phase I SBIR will demonstrate the feasibility of building databases of relationships between residual/applied stress and multi-directional MWM-Array measured premeability, along with the capability to correct for geometric, cold work/plasticity, and other complexities. This includes the use of very low frequency methods to provide thru wall stress imaging. This program will leverage other DOT and customer funded efforts that are developing field durable electronics and scanners; enabling us to focus on quantitative imaging of stresses.