CAPESYM INC — Department of Energy SBIR Phase II: 14a

Description

Modern synchrotron-based X-ray imaging techniques, such as coherent X-ray diffraction imaging and phase-contrast imaging require high beam coherence and highly penetrating X-rays. The new generation of synchrotrons achieves enhanced coherence at beam energies greater than 30-50keV. These new prospects for non-destructive imaging require high spatial resolution and efficient large area detectors. Current X-ray detectors are limited in efficiency (Si-based) and spatial resolution (scintillator-based) and cannot meet the current imaging demands. Under this SBIR program, we will develop and commercialize a high spatial resolution highly-scalable X-ray detector system using a novel radiation-hard high-Z semiconductor. The major achievements of phase I were: (a) Detector structure optimization, (b) Deposition and demonstration of the detector capabilities using a photon-counting system, and (c) Design and test feasibility of the detector-specific CMOS array with high spatial resolution. In phase II, the detector will be further optimized for this particular application and a prototype detector will be developed using a CMOS backplane. The commercial availability of the proposed detectors will enable imaging of nano-scale structural features of novel materials, with applications ranging from energy storage to stronger metals. It is widely recognized that the next generation of advanced materials will be based on a better understanding and controlling the nano-scale features of these materials. High energy X-ray imaging, such as coherent X-ray diffraction imaging and phase-contrast imaging, are indispensable tools for micro- and nano-scale materials characterization. These detectors also have immense potential for commercial applications in medical and industrial imaging applications.