PANERATECH, INC. — Department of Defense SBIR Phase I: ABSTRACT: PaneraTech is proposing a very innovative Inline Material Sensor (IMS) and tagg

Description

ABSTRACT: PaneraTech is proposing a very innovative Inline Material Sensor (IMS) and tagging system that utilizes broadband dual-polarized RF probes to real-time assess electrical performance of thin films and mat materials during production and prepregging. Our proposed sensor is also designed to detect any physical flaws such as voids, slits or cracks in the film to ensure 100% physical integrity of the film. Our preliminary studies show that we can readily detect any changes in electrical properties and also presence of any physical flaws. During Phase I, we will carry out a more detailed and comprehensive analysis to characterize performance of our proposed IMS sensor with various films of varying EMI shielding properties and various size of flaws and orientations in the film. BENEFIT: The proposed Inline Material Sensor offers significant benefits to DoD and aircraft manufacturers by ensuring expected shielding and electrical functionality of thin films and mat materials before they are used in various aircraft parts. This will also eliminate any re-work or scrape and thus save program costs. By ensuring that thin films and mat materials will not be delivered to the airframe integrator before they are checked for 100% electrical and physical compliance, we will eliminate and use of defective material in the aircraft and reduce the risk that defective material could be used in aircraft production.