ALTRON, INC. — Department of Defense SBIR Phase I: N231-029

Description

Complex Naval control systems go through numerous rounds of rigorous testing often spanning multiple years. As testers execute formalized assessments during these test events, issues arise, and the issues are documented in software problem reports (SPRs). Multiple factors may limit the ability of a tester to properly document issues for future replication or investigation, such as the rapid pace and sensitivity at which the tests are performed. When the issue gets assigned to a developer, significant data required to repeat or categorize the issue may not be available due to lack of documentation or amplifying information. Situations like these lead to a significant number of problem reports going unresolved and delivered in the deployed product. Altron is proposing to conduct research and development (R&D) to determine the technical feasibility of creating a novel technology that will perform data aggregation and data analytics to correlate system inputs, system logs and metadata to support SPR capture. As the data types fed into this correlation algorithm increase, an ontology will be created that categorizes and details the bugs. These captured details will help unburden testers from having to investigate many bugs themselves. Instead, they can create a SPR with the details this technology provides and continue with their test plan. With this comprehensive dataset captured by the technology, developers will have reliable recreation and amplifying information at their disposal to diagnose issues.