XUV LASERS, INC. — Department of Defense SBIR Phase I: ST15C-001

XUV LASERS, INC. — SBIR Phase I award from Department of Defense.

Phase I SBIR feasibility signal

  • Phase I awards fund proof-of-concept work. For capture teams, they mark early interest from Department of Defense in a technical approach.
  • Watch for Phase II follow-ons from the same firm/topic family — that conversion path is where budgets and transition pressure rise.
  • Obligated amount $154,864. Cross-check similar awards in the same agency and technology tags for going-rate context.
  • Topic code ST15C-001 links this award to a solicitation family — search the same topic stem for incumbents and recompete timing.

Informational capture context from public federal data — not legal or bid advice.

Amount
$154,864
Agency
Department of Defense · Defense Advanced Research Projects Agency
Program / Phase
SBIR · Phase I
Topic
ST15C-001
Solicitation
2015.0
NAICS
Place of performance
CO
Period
2016-04-25 → 2017-07-24

Description

We propose to develop a high-resolution soft x-ray nanoscope based on Fourier Transform Holography which has the very important advantage for real time visualization: 3D images are nearly instantaneously retrieved with a simple 2D Fast Fourier Transform operation. The table-top soft x-ray nanoscope will use for illumination a compact high average power soft x-ray laser that generates high energy pulses with full spatial coherence. This unique high repetition rate soft x-ray laser in combination with an extremely fast and robust image retrieving method will result in a powerful new imaging instrument for the study of morphological, mechanical, and physical properties of samples in a variety of environments in real time. Moreover, utilizing the same setup it will be possible to implement tomo-holography and holographic interferometry that will further potentiate the capabilities of the table-top nanoscope. These modes of operation will add new dimensions to the instrument allowing tomographic images and sub-wavelength resolution interferometry to measure physical changes in nano-structured samples.