Chip Design Systems Inc. — Department of Defense SBIR Phase I: ABSTRACT: This project aims to develop a Short Wave Infrared band image projector to prov

Description

ABSTRACT: This project aims to develop a Short Wave Infrared band image projector to provide real time detector stimulation with high dynamic range. Our emitter technology is based on GaInAsSb quaternary semiconductor LED arrays hybridized to CMOS read-in integrated circuits. This project leverages read-in circuit design and control electronics that were developed under SLEDS - a longer wavelength projector program. By leveraging existing system components, we aim to increase the likelihood of project success, reduce program cost, and ensure compatibility with existing systems. Phase 1 effort will focus on fabrication and characterization of emitter devices and design study of read-in circuits and control electronics. BENEFIT: The commercial application of this program is the development of an SWIR image projector with unprecedented resolution capable of testing a wide variety of high-resolution SWIR detector arrays. These detectors are currently too large to be tested using existing SWIR image projectors. In addition to their military application, SWIR detectors are useful for inspection of continuous processes such as high temperature manufacturing processes, plastics recycling of automotive and consumer products, agricultural raw material cleaning and sorting, and a growing biological imaging technique, spectral-domain optical coherence tomography.